Syllabus ( MSE 613 )
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Basic information
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| Course title: |
Materials Characterization Techniques |
| Course code: |
MSE 613 |
| Lecturer: |
Prof. Dr. Hüseyin YILMAZ
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| ECTS credits: |
7.5 |
| GTU credits: |
3 (3+0+0) |
| Year, Semester: |
1/1, Fall and Spring |
| Level of course: |
Second Cycle (Master's) |
| Type of course: |
Area Elective
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| Language of instruction: |
English
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| Mode of delivery: |
Face to face
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| Pre- and co-requisites: |
None |
| Professional practice: |
No |
| Purpose of the course: |
Analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. How to analyze metals, ceramics, polymers, semiconductors, or composites |
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Learning outcomes
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Upon successful completion of this course, students will be able to:
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Tell analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films.
Contribution to Program Outcomes
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Define and manipulate advanced concepts of Materials Science and Engineering
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Embrace modern methods and tools in the field of materials science and engineering
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Acquire scientific knowledge
Method of assessment
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Written exam
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Analyze metals, ceramics, polymers, semiconductors, or composites.
Contribution to Program Outcomes
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Define and manipulate advanced concepts of Materials Science and Engineering
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Formulate and solve advanced engineering problems
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Embrace modern methods and tools in the field of materials science and engineering
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Acquire scientific knowledge
Method of assessment
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Laboratory exercise/exam
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Establish interrelationships and interdependence between processing, structure, properties, and performance
Contribution to Program Outcomes
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Define and manipulate advanced concepts of Materials Science and Engineering
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Formulate and solve advanced engineering problems
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Embrace modern methods and tools in the field of materials science and engineering
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Acquire scientific knowledge
Method of assessment
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Written exam
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Contents
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| Week 1: |
Contact Angle in Surface Analysis |
| Week 2: |
X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy |
| Week 3: |
Scanning Tunneling Microscopy |
| Week 4: |
Atomic Force Microscopy |
| Week 5: |
X-ray Diffraction |
| Week 6: |
X-ray Diffraction |
| Week 7: |
Transmission Electron Microscopy |
| Week 8: |
Visa |
| Week 9: |
ansmission Electron Microscopy |
| Week 10: |
Scanning Electron Microscopy |
| Week 11: |
Scanning Electron Microscopy |
| Week 12: |
Infrared Spectroscopy and UV/Vis Spectroscopy |
| Week 13: |
Infrared Spectroscopy and UV/Vis Spectroscopy |
| Week 14: |
Macro and Micro Thermal Analyses |
| Week 15*: |
Macro and Micro Thermal Analyses |
| Week 16*: |
Final exam |
| Textbooks and materials: |
Materials Characterization Techniques, Lin Li, Ashok Kumar, CRC Press, 2008 |
| Recommended readings: |
Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series), C. R. Brundle, Charles A. Evans, Shaun Wilson, Butterworth-Heinemann, 1992 |
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* Between 15th and 16th weeks is there a free week for students to prepare for final exam.
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Assessment
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| Method of assessment |
Week number |
Weight (%) |
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| Mid-terms: |
8 |
40 |
| Other in-term studies: |
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0 |
| Project: |
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0 |
| Homework: |
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0 |
| Quiz: |
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0 |
| Final exam: |
16 |
60 |
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Total weight: |
(%) |
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Workload
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| Activity |
Duration (Hours per week) |
Total number of weeks |
Total hours in term |
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| Courses (Face-to-face teaching): |
3 |
14 |
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| Own studies outside class: |
3 |
14 |
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| Practice, Recitation: |
0 |
0 |
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| Homework: |
6 |
10 |
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| Term project: |
0 |
0 |
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| Term project presentation: |
0 |
0 |
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| Quiz: |
0 |
0 |
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| Own study for mid-term exam: |
15 |
1 |
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| Mid-term: |
1 |
1 |
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| Personal studies for final exam: |
10 |
2 |
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| Final exam: |
2 |
1 |
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Total workload: |
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Total ECTS credits: |
* |
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* ECTS credit is calculated by dividing total workload by 25.
(1 ECTS = 25 work hours)
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