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Syllabus ( NANO 624 )

   Basic information
Course title: Scanning Electron Microscopy
Course code: NANO 624
Lecturer: Assist. Prof. Recep ÖNLER
ECTS credits: 7,5
GTU credits: 3 (3+0+0)
Year, Semester: 2019, Fall and Spring
Level of course: Third Cycle (Doctoral)
Type of course: Area Elective
Language of instruction: English
Mode of delivery: Face to face , Lab work
Pre- and co-requisites: none
Professional practice: No
Purpose of the course: During the scanning electron microscopy course, students learn through lecture, demonstration, and hands-on participation how to setup and operate SEM and EDS instruments. This SEM training provides a foundation for students new to SEM and EDS. At the end of the course students with no prior experience are able to , obtain secondary electron (SE) and backscatter electron (BE) micrographs, and perform EDS qualitative and quantitative analysis.
   Learning outcomes Up

Upon successful completion of this course, students will be able to:

  1. provides a concise and accessible introduction to the essentials of SEM

    Contribution to Program Outcomes

    1. To be knowledgeable and practical about the production and characterization techniques of materials and devices in nano scale.
    2. To follow the scientific publications in the field of nanotechnology and have an idea about the researches.
    3. Acquire scientific knowledge
    4. Find out new ways to improve current knowledge
    5. Present and defence the research outcomes at seminars and conferences
    6. Be aware of the importance of nanoscience and nanoengineering in understanding the working principles of the new generation nano devices

    Method of assessment

    1. Written exam
    2. Homework assignment
    3. Laboratory exercise/exam
    4. Seminar/presentation
  2. highlights recent advances in instrumentation, imaging and sample preparation techniques

    Contribution to Program Outcomes

    1. To be knowledgeable and practical about the production and characterization techniques of materials and devices in nano scale.
    2. To follow the scientific publications in the field of nanotechnology and have an idea about the researches.
    3. Acquire scientific knowledge
    4. Develop an awareness of continuous learning in relation with modern technology.
    5. Be aware of the importance of nanoscience and nanoengineering in understanding the working principles of the new generation nano devices

    Method of assessment

    1. Written exam
    2. Laboratory exercise/exam
    3. Seminar/presentation
  3. offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds

    Contribution to Program Outcomes

    1. To be knowledgeable and practical about the production and characterization techniques of materials and devices in nano scale.
    2. To follow the scientific publications in the field of nanotechnology and have an idea about the researches.
    3. Acquire scientific knowledge
    4. Find out new ways to improve current knowledge
    5. Present and defence the research outcomes at seminars and conferences
    6. Demonstrating professional and ethical responsibility.

    Method of assessment

    1. Written exam
    2. Seminar/presentation
   Contents Up
Week 1: The basic properties of light and microscopy
Week 2: Diffraction of light from circular aperture
Week 3: Resolution and contrast
Week 4: Electron column and electron guns
Week 5: Magnetic Lenses
Week 6: Electron optics
Week 7: Aberrations in the lenses
Week 8: Electron Beam Specimen Interactions
Week 9: Secondary electron imaging
Week 10: Scintillation Detectors
Week 11: Backscattered electron imaging
Week 12: Solid State Detectors
Week 13: Energy dispersive spectroscopy
Week 14: Image Processing
Week 15*: Image Interpretation
Week 16*: Final Exam
Textbooks and materials: Scanning Electron Microscopy and X-Ray Microanalysis
Third Edition
Authors: Goldstein, J., Newbury, D.E., Joy, D.C., Lyman, C.E., Echlin, P., Lifshin, E., Sawyer, L., Michael, J.R.
Recommended readings: A Beginners' Guide to Scanning Electron Microscopy
Authors: Ul-Hamid, Anwar
  * Between 15th and 16th weeks is there a free week for students to prepare for final exam.
Assessment Up
Method of assessment Week number Weight (%)
Mid-terms: 0
Other in-term studies: 0
Project: 3-15 20
Homework: 3,5,7,9,11 20
Quiz: 2,4,6,8,10,12 20
Final exam: 16 40
  Total weight:
(%)
   Workload Up
Activity Duration (Hours per week) Total number of weeks Total hours in term
Courses (Face-to-face teaching): 3 15
Own studies outside class: 3 15
Practice, Recitation: 0 0
Homework: 2 5
Term project: 30 1
Term project presentation: 0 0
Quiz: 2 6
Own study for mid-term exam: 0 0
Mid-term: 0 0
Personal studies for final exam: 40 1
Final exam: 0 0
    Total workload:
    Total ECTS credits:
*
  * ECTS credit is calculated by dividing total workload by 25.
(1 ECTS = 25 work hours)
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